Journal Article
January 22, 2018
Cited 8 times
Source: Crossref (11/03/2026)
EUV polarimetry for thin film and surface characterization and EUV phase retarder reflector development
A. E. H. Gaballah, P. Nicolosi, Nadeem Ahmed, K. Jimenez, G. Pettinari, A. Gerardino, P. Zuppella
Review of Scientific Instruments • Vol. 89 (1) • AIP Publishing
