EUV reflective ellipsometry in laboratory: determination of the optical constants and phase retarder properties of SiO2 at hydrogen Lyman–alpha

Nadeem Ahmed Malik, Piergiorgio Nicolosi, Ahmed E. H. Gaballah, Kety Jimenez, Paola Zuppella

EUV and X-ray Optics: Synergy between Laboratory and Space VI • pp. 32 • SPIE