proceedings-article
15 de Mayo, 2017
Fuente: Crossref (02/12/2025)
Optical and structural characterization of Nb, Zr, Nb/Zr, Zr/Nb thin films on Si3N4membranes windows
K. Jimenez, A. E. H. Gaballah, Nadeem Ahmed, P. Zuppella, P. Nicolosi
SPIE Proceedings • Vol. 10236 • pp. 102360K • SPIE
